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Analytical study of thermally assisted photoelectron emission from real iron surfaces: dependence on temperature and wavelength

机译:真实铁表面热辅助光电子发射的分析研究:取决于温度和波长

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摘要

In our previous papers, two types of dependence of photoelectron emission from real iron surfaces on the temperature and on the wavelength of the irradiating light at normal atmospheric pressure have been reported (Momose et al. in Appl Phys A 117:1525, 2014; 118:637, 2015). The first article reported experimental curves of the intensity versus temperatures in the 298-626 K range under light irradiation with wavelengths of 200, 210, 220, and 230 nm, called as thermally assisted photoelectron emission (TAPE) (Momose et al. 2014), whereas the second article reported experimental curves of the TAPE intensity versus wavelength for irradiating light in the 300-170 nm range at 298, 381, 425, 476, 527, 576, or 626 K (Momose et al. 2015). In the present paper, these two results were simultaneously discussed based on the Fowler-DuBridge (FD) theory, where the intensity of photoelectron emission is described by the two parameters of the work function, I center dot, and a probability factor, alpha A. It was concluded from the dependence on wavelength (Momose et al. 2015) of the TAPE intensity that the I center dot value and the alpha A value were represented by a saturation function and a linear function, respectively, with respect to temperature. However, the FD theory using the temperature dependence of I center dot and alpha A could not yield that of the TAPE intensity (Momose et al. 2014). To resolve the discrepancy between the two kinds of the TAPE measurements, a curve-fitting method is constructed based on the following three assumptions: two types of the photoelectrons are present, namely hot electrons and thermalized electrons; the former are involved in a thermal desorption process of adsorbates and the latter need a thermal activation energy to escape to vacuum; and thermally stimulated exoelectrons are included in the TAPE phenomenon. The results of applying the method to the TAPE glow curves (Momose et al. 2014) concluded that the release of hot electrons into vacuum was suppressed by the adsorbed H2O on the real iron surface and the desorption energy of the adsorbed H2O was 0.43 eV for 200 nm and 0.48 eV for 210 nm light irradiation. It was further confirmed that the activation energy which the thermalized electrons need to escape to vacuum was 0.20 and 0.13 eV for 200 and 210 nm, respectively. The relationship between this activation energy and the wavelength of the irradiated light is consistent with the results of Momose et al. (2014).
机译:在我们以前的论文中,已经报道了在正常大气压下真实铁表面的光电子发射与温度和照射光的波长之间的两种依赖关系(Momose等人,Appl Phys A 117:1525,2014; 118 :637,2015)。第一篇文章报道了在波长为200、210、220和230 nm的光照射下298-626 K范围内强度与温度的实验曲线,称为热辅助光电子发射(TAPE)(Momose et al。2014) ,而第二篇文章则报道了在298、381、425、476、527、576或626 K照射300-170 nm范围内的光时TAPE强度与波长的实验曲线(Momose等人,2015)。在本文中,这两个结果是根据Fowler-DuBridge(FD)理论同时讨论的,其中光电子发射的强度由功函数的两个参数I中心点和概率因子αA来描述。从TAPE强度对波长的依赖性(Momose等人,2015年)得出结论,相对于温度,I中心点值和alpha A值分别由饱和度函数和线性函数表示。但是,使用I中心点和αA的温度依赖性的FD理论无法得出TAPE强度的FD理论(Momose等人,2014)。为了解决两种TAPE测量之间的差异,基于以下三个假设构造了一种曲线拟合方法:存在两种类型的光电子,即热电子和热电子。前者参与吸附物的热脱附过程,后者需要热活化能才能逃逸至真空。 TAPE现象包括热激发的外电子。将这种方法应用于TAPE辉光曲线的结果(Momose等人,2014年)得出的结论是,实际铁表面上吸附的H2O抑制了热电子向真空中的释放,并且H2O的脱附能为0.43 eV。 200 nm和0.48 eV用于210 nm的光照射。进一步证实,对于200nm和210nm,热化电子需要逃逸至真空的活化能分别为0.20和0.13eV。该活化能与照射光的波长之间的关系与Momose等人的结果一致。 (2014)。

著录项

  • 来源
    《Applied Physics》 |2018年第8期|534.1-534.9|共9页
  • 作者单位

    Ashikaga Inst Technol, Ashikaga 3268558, Japan;

    Ibaraki Univ, Dept Mat Sci, 4-12-1 Nakanarusawa, Hitachi, Ibaraki 3168511, Japan;

    Inst Mesotechnol, 2-2-1-201 Nakahara, Kashiwa, Chiba 2770085, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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