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Immersion transmission ellipsometry (ITE): a new method for the precise determination of the 3D indicatrix of thin films

机译:浸没透射椭圆仪(ITE):一种精确测定薄膜3D指标的新方法

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摘要

The new method of immersion transmission ellipsometry (ITE) has been developed. It allows the highly accurate determination of the absolute three-dimensional (3D) refractive indices of anisotropic thin films. The method is combined with conventional ellipsometry in transmission and reflection, and the thickness determination of anisotropic films solely by optical methods also becomes more accurate. The method is applied to the determination of the 3D refractive indices of thin spin-coated films of an azobenzene-containing liquid-crystalline copolymer. The development of the anisotropy in these films by photo-orientation and subsequent annealing is demonstrated. Depending on the annealing temperature, oblate or prolate orders are generated.
机译:已经开发了浸入式透射椭偏仪(ITE)的新方法。它可以高度精确地确定各向异性薄膜的绝对三维(3D)折射率。该方法在透射和反射中与常规椭圆偏振法相结合,并且仅通过光学方法确定各向异性膜的厚度也变得更加准确。该方法用于测定含偶氮苯的液晶共聚物的旋涂薄膜的3D折射率。证明了通过光取向和随后的退火在这些膜中各向异性的发展。根据退火温度,产生扁长或扁长的次序。

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