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Optical and structural characterization of iron oxide and cobalt oxide thin films at 800 nm

机译:氧化铁和氧化钴薄膜在800 nm处的光学和结构表征

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摘要

We report on optical and structural properties of α-Fe_2O_3 and Co_3O_4 thin films, grown by direct oxidation of pure metal films deposited on soda-lime glass. Structural characteristics and morphology of the films were investigated by X-ray diffraction, atomic force microscopy, and scanning electron microscopy. Linear optical absorption, and linear refraction as well as nonlinear optical properties were investigated. The third-order optical susceptibilities were measured applying the Thermally managed Z-scan technique using a Ti: sapphire laser (150 fs; 800 nm). The results obtained for the Co_3O_4 film were ReX~(3) = -(5.7 ± 2.4) ×10~(-9) esu and ImX~(3) = -(1.8 ± 0.2) x 10~(-8) esu while for the α-Fe_2O_3 film we determined ReX~(3) = +(6.6 ± 2.4) ×10~(-10) esu and ImX~(3) = +(2.2 ± 0.4)× 10~(-10) esu.
机译:我们报告了通过直接氧化沉积在钠钙玻璃上的纯金属膜而生长的α-Fe_2O_3和Co_3O_4薄膜的光学和结构性质。通过X射线衍射,原子力显微镜和扫描电子显微镜研究了膜的结构特征和形态。研究了线性光学吸收,线性折射以及非线性光学性质。使用使用Ti:蓝宝石激光器(150 fs; 800 nm)的热管理Z扫描技术测量三阶光学磁化率。 Co_3O_4薄膜的结果为ReX〜(3)=-(5.7±2.4)×10〜(-9)esu和ImX〜(3)=-(1.8±0.2)x 10〜(-8)esu对于α-Fe_2O_3薄膜,我们确定ReX〜(3)= +(6.6±2.4)×10〜(-10)esu和ImX〜(3)= +(2.2±0.4)×10〜(-10)esu。

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  • 来源
    《Applied physics》 |2013年第2期|313-321|共9页
  • 作者单位

    Departamento de Fisica, Universidade Federal de Pernambuco, Recife, PE 50670-901, Brazil;

    Programa de Pos-Graduacao em Ciencia de Materiais, Universidade Federal de Pernambuco, Recife, PE 50670-901, Brazil ,Colegio Militar do Recife Exercito Brasileiro, Recife, PE 50730-120, Brazil;

    Departamento de Fisica, Universidade Federal de Pernambuco, Recife, PE 50670-901, Brazil;

    Departamento de Fisica, Universidade Federal de Pernambuco, Recife, PE 50670-901, Brazil;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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