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Selective detection of tetrahedral units in amorphous GeTe-based phase change alloys using Ge L3-edge x-ray appearance near-edge structure spectroscopy

机译:Ge L3边缘x射线外观近边缘结构光谱法选择性检测基于GeTe的非晶态相变合金中的四面体单元

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摘要

Using Ge L3-edge x-ray appearance near-edge structure (XANES) studies, we demonstrate a noticeable difference in local structure between amorphous and thermally crystallized GeTe-based phase change alloys. The pronounced change appears as a step-like feature at the absorption edge corresponding to a 2p??5s (4d) electron transition. Comparison with ab initio XANES simulations suggest that the step-like feature is due to the presence of tetrahedrally coordinated Ge atoms in the as-deposited samples. The obtained results demonstrate that Ge L3-edge XANES can be used as a structural probe for the existence of tetrahedral Ge sites in GeTe-based phase change alloys.
机译:使用Ge L 3 -边缘x射线外观近边缘结构(XANES)研究,我们证明了非晶态和热结晶的GeTe基相变合金之间的局部结构存在明显差异。明显的变化在对应于2p 2方程→5 5s(4d)电子跃迁的吸收边缘上呈现出阶梯状特征。与从头开始的XANES模拟的比较表明,阶梯状特征是由于沉积样品中存在四面体配位的Ge原子。所得结果表明,Ge L 3 -边缘XANES可以作为结构探针用于GeTe基相变合金中四面体Ge位点的存在。

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