In-plane anisotropic 2D CrPS_4 for promising polarization-sensitive photodetection

摘要

Polarized photodetectors have been widely used in military and civilian applications. The investigation of promising two-dimensional materials with low symmetry structures will be of great significance for the development of polarized integrated nanodevices. In this work, chromium thiophosphate (CrPS_4), a ternary layered semiconductor with low symmetry puckered structures and unique linear dichroism (LD) conversion behavior is introduced to act as a polarization-sensitive photodetector. Angle-resolved polarized Raman spectra (ARPRS), polarization-resolved photoluminescence (PL) spectra, polarization-resolved absorption spectroscopy (PRAS), and electrical transport measurement systematically indicate intriguing anisotropic optical and electrical properties in 2D (two-dimensional) CrPS_4. The photodetector of CrPS_4 shows a linear anisotropy ratio of ≈1.33 with 405 nm illumination. This pioneering research not only stimulates interest in the development of novel anisotropic 2D materials but also enriches the family of polarization-sensitive photodetectors.