首页> 外文期刊>Applied Physics Letters >Interconversion of complementary resistive switching from graphene oxide based bipolar multilevel resistive switching device
【24h】

Interconversion of complementary resistive switching from graphene oxide based bipolar multilevel resistive switching device

机译:基于石墨烯的双极多电平电阻切换装置的互补电阻切换的互连

获取原文
获取原文并翻译 | 示例
       

摘要

In this work, organic material-based resistive switching mechanisms were studied by using graphene oxide as the switching layer. With the insertion of a charge trapping graphene layer, the device showed good stability and good electrical bipolar switching properties, with an ON/ OFF ratio about 10~2-10~3. The device gradually shifted toward complementary switching behavior while maintaining an ON/OFF ratio of ~10~2 from bipolar switching behavior after a specific number of consecutive DC switching cycles with increases in the SET-RESET voltage. The conduction mechanisms for bipolar (P-F conduction) and the complementary switching were verified based on the electrical characteristics and curve fittings. Rapid increases in the injected electrons due to increased voltage in complementary switching facilitated the formation of an intermediate charge reservoir region that, in turn, enhanced performance. The device showed a retention period as high as 10~4 s at 85 °C and good DC endurance. The device is also capable of multi-resistance states to obtain multi-bit (4-bit) data storage, leading to high density memory realization.
机译:在这项工作中,通过使用石墨烯作为开关层研究了基于有机材料的电阻切换机构。随着电荷捕获石墨烯层的插入,该装置显示出良好的稳定性和良好的电双极开关性能,开/关比约为10〜2-10〜3。该器件逐渐朝向互补切换行为移位,同时在特定数量的连续DC切换循环之后从双极切换行为保持〜10〜2的开/关比随着设定复位电压的增加。基于电特性和曲线配件,验证了双极(P-F传导)的传导机制和互补切换。由于互补切换中的电压增加,注入电子的快速增加便于形成中间电荷储存区的形成,又提高了性能。该器件显示85°C的保留时段高达10〜4 s,良好的直流耐久性。该装置还能够获得多电阻状态以获得多位(4位)数据存储,导致高密度存储器实现。

著录项

  • 来源
    《Applied Physics Letters》 |2020年第5期|054101.1-054101.5|共5页
  • 作者单位

    Institute of Microelectronics Department of Electrical Engineering National Cheng Kung University No. 1 University Road Tainan City 701 Taiwan;

    Institute of Microelectronics Department of Electrical Engineering National Cheng Kung University No. 1 University Road Tainan City 701 Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 22:17:58

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号