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On the origin of red luminescence from iron-doped β-Ga_2O_3 bulk crystals

机译:从铁掺杂β-GA_2O_3散装晶体的红色发光起源

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摘要

Currently, Fe doping in the ~10~(18) cm~(-3) range is the most widely available method for producing semi-insulating single crystalline β-Ga_2O_3 substrates. Red luminescence features have been reported from multiple types of Ga_2O_3 samples, including Fe-doped β-Ga_2O_3, and attributed to Fe or N_O. Herein, however, we demonstrate that the high-intensity red luminescence from Fe-doped β-Ga_2O_3 commercial substrates consisting of two sharp peaks at 689 nm and 697 nm superimposed on a broader peak centered at 710 nm originates from Cr impurities present at a concentration near 2 ppm. The red emission exhibiting a twofold symmetry, peaks in intensity for excitation near the absorption edge, seems to compete with the Ga_2O_3 emission at a higher excitation energy and appears to be intensified in the presence of Fe. Based on the polarized absorption, luminescence observations, and the Tanabe-Sugano diagram analysis, we propose a resonant energy transfer of photo-generated carriers in the β-Ga_2O_3 matrix to octahedrally coordinated Cr~(3+) to give red luminescence, possibly also sensitized by Fe~(3+).
机译:目前,在〜10〜(18)cm〜(-3)范围内的Fe掺杂是最广泛的制造半绝缘单晶β-Ga_2O_3基板的方法。从多种类型的Ga_2O_3样本报告了红色发光特征,包括Fe掺杂的β-Ga_2O_3,并归因于Fe或N_O。然而,在此证明,来自Fe掺杂的β-GA_2O_3商业衬底的高强度红色发光,其由689nm和697nm的两个尖峰组成,叠加在以710nm为中心的较宽峰上,来自于浓度的Cr杂质接近2 ppm。表现出双重对称性的红色发射,在吸收边缘附近激发强度的峰值,似乎在更高的激发能中与Ga_2O_3发射竞争,并且在Fe的存在下似乎增强。基于偏振吸收,发光观察和Tanabe-sugano图分析,我们提出了β-Ga_2O_3基质中的光产生载体的共振能量转移至八面体协调的Cr〜(3+),以给予红色发光,也可能由fe〜(3+)感染。

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  • 来源
    《Applied Physics Letters》 |2020年第5期|052101.1-052101.5|共5页
  • 作者单位

    Electrical and Computer Engineering University of Utah Salt Lake City Utah 84112 USA;

    Electrical and Computer Engineering University of Utah Salt Lake City Utah 84112 USA;

    Materials Science and Engineering Program Washington State University Pullman Washington 99164 USA;

    Materials Science and Engineering Program Washington State University Pullman Washington 99164 USA;

    Electrical and Computer Engineering University of Utah Salt Lake City Utah 84112 USA Materials Science and Engineering University of Utah Salt Lake City Utah 84112 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 22:17:58

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