首页> 外文期刊>Applied Physics Letters >Fourier single-pixel imaging using fewer illumination patterns
【24h】

Fourier single-pixel imaging using fewer illumination patterns

机译:使用较少照明模式的傅里叶单像素成像

获取原文
获取原文并翻译 | 示例
       

摘要

Single-pixel imaging (SPI), which is generally based on computational imaging, has the advantages of a wide bandwidth and the ability to image objects beyond the visual field. However, the major challenge in developing SPI is the large number of illumination patterns that are required. Unlike traditional SPI that relies on random measurement patterns, the SPI method proposed in this letter involves a two-step phase shift that reduces greatly the required number of illumination patterns. Theoretical analysis shows that 6724 illumination patterns are required to reconstruct a 128x128-pixel image whose peak signal-to-noise ratio exceeds 30, and these can be projected in 0.3362 s with a digital micromirror device working at full speed. Compared to SPI with a four-step phase shift, half the number of illumination patterns are required. Verification experiments show that the reconstructed images can be obtained even at a sampling ratio of 20%. The proposed SPI with a two-step phase shift is an effective means of requiring fewer illumination patterns and has great potential in dynamic detection.
机译:单像素成像(SPI)通常基于计算成像,具有宽带宽的优点,以及图像对象超出视野的能力。然而,开发SPI的主要挑战是所需的大量照明模式。与依赖于随机测量模式的传统SPI不同,本字母中提出的SPI方法涉及两步相移,其减少了大量的照明模式。理论分析表明,需要6724照明图案来重建峰值信噪比超过30的128x128像素图像,并且这些可以在0.3362 s中投影,其中数字微镜器件以全速工作。与具有四步相移的SPI相比,需要一半的照明图案的数量。验证实验表明,即使以20%的采样率也可以获得重建的图像。具有两步相移的所提出的SPI是需要更少照明模式并且在动态检测中具有很大潜力的有效手段。

著录项

  • 来源
    《Applied Physics Letters》 |2019年第22期|221906.1-221906.5|共5页
  • 作者单位

    Hefei Univ Technol Sch Instrument Sci & Optoelect Engn Hefei 230009 Anhui Peoples R China;

    Hefei Univ Technol Sch Instrument Sci & Optoelect Engn Hefei 230009 Anhui Peoples R China;

    Hefei Univ Technol Sch Instrument Sci & Optoelect Engn Hefei 230009 Anhui Peoples R China;

    Hefei Univ Technol Sch Instrument Sci & Optoelect Engn Hefei 230009 Anhui Peoples R China;

    Hefei Univ Technol Sch Instrument Sci & Optoelect Engn Hefei 230009 Anhui Peoples R China;

    Hefei Univ Technol Sch Instrument Sci & Optoelect Engn Hefei 230009 Anhui Peoples R China;

    Hefei Univ Technol Sch Instrument Sci & Optoelect Engn Hefei 230009 Anhui Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 22:17:47

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号