Multiple-crystal x-ray topographic characterization of periodically domain-inverted KTiOPO_4 crystal

摘要

A periodically domain-inverted KTiOPO_4 crystal has been characterized for the first time by multiple-crystal multiple-reflection x-ray topography. The striation contrast within the domain-inverted regions has been revealed in high strain-sensitivity reflection topographs. The origin of formation of the striation contrast and the mechanism of domain inversion in KTiOPO_4 are discussed in terms of the structural characteristics of KTiOPO_4.