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Effects of Ag/indium tin oxide contact to a SiC doping layer on performance of Si nanocrystal light-emitting diodes

机译:Ag /铟锡氧化物接触SiC掺杂层对Si纳米晶体发光二极管性能的影响

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摘要

We report on the effects of a very thin Ag (2.5 nm) interlayer between the indium tin oxide (ITO) current spreading layer and a SiC doping layer on silicon nanocrystals (nc-Si) embedded in silicon nitride film on the electrical and optical performance of the light-emitting diodes (LEDs). The forward voltage at a current of 20 mA of the nc-Si LED with a Ag interlayer was decreased by 2.5 V compared to that of the nc-Si LED without one due to the decrease in the contact resistance. In addition, the light output power of the nc-Si LED with a Ag interlayer was also enhanced by 40%. This result strongly indicates that the Ag/ITO contact scheme can serve as a highly promising contact scheme to a SiC film for the realization of the nc-Si LEDs with a high efficiency.
机译:我们报告了铟锡氧化物(ITO)电流扩散层和SiC掺杂层之间非常薄的Ag(2.5 nm)中间层对氮化硅膜中嵌入的硅纳米晶体(nc-Si)的电学和光学性能的影响的发光二极管(LED)。与没有中间层的nc-Si LED相比,具有Ag夹层的nc-Si LED在20 mA电流下的正向电压降低了2.5 V,这是由于接触电阻的降低。此外,带有Ag中间层的nc-Si LED的光输出功率也提高了40%。该结果有力地表明,Ag / ITO接触方案可以用作与SiC膜的高度有前途的接触方案,以高效地实现nc-Si LED。

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