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首页> 外文期刊>Applied Physics Letters >Ultrafast carrier dynamics in In_xGa_(1-x)N (0001) epilayers: Effects of high fluence excitation
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Ultrafast carrier dynamics in In_xGa_(1-x)N (0001) epilayers: Effects of high fluence excitation

机译:In_xGa_(1-x)N(0001)外延层中的超快载流子动力学:高能流激发的影响

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摘要

Ultrafast carrier dynamics in In_xGa_(1-x)N (0001) epilayers were investigated, using femtosecond transient differential transmission and reflection measurements for x = 0.07, 0.15, and 0.33, over a fluence range of 1-12 mJ/cm~2. Stimulated emission as well as band gap renormalization play a crucial role in the dynamics of the photogenerated carriers. Threshold fluence leading to saturation of the differential reflectivity and transmission signals related to the In mole fraction has been observed, which is attributed to band gap renormalization, Auger process, and carrier recombination through In-rich nanoclusters. Furthermore, coherent acoustic phonon oscillations have also been observed in the In_(0.15)Ga_(0.85)N at high fluence excitation.
机译:研究了In_xGa_(1-x)N(0001)外延层中的超快载流子动力学,使用飞秒瞬态差分传输和反射测量,在1-12 mJ / cm〜2的注量范围内,x = 0.07、0.15和0.33。受激发射以及带隙归一化在光生载流子的动力学中起着至关重要的作用。观察到阈值通量导致差分反射率饱和,并且观察到与In摩尔分数有关的透射信号,这归因于带隙重新归一化,俄歇过程以及通过富In纳米团簇的载流子复合。此外,在高通量激发下,在In_(0.15)Ga_(0.85)N中也观察到相干声子振动。

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