...
首页> 外文期刊>Applied Physics Letters >Simultaneous direct detection of sub keV molecular and atomic ions with a delta-doped charge-coupled device at the focal plane of a miniature mass spectrometer
【24h】

Simultaneous direct detection of sub keV molecular and atomic ions with a delta-doped charge-coupled device at the focal plane of a miniature mass spectrometer

机译:在微型质谱仪的焦平面上使用掺do电荷耦合装置同时直接检测亚keV分子和原子离子

获取原文
获取原文并翻译 | 示例

摘要

A delta-doped charge-coupled device (CCD) was used for the simultaneous and direct detection of low-energy atomic and molecular ions dispersed along the focal plane of a miniature mass spectrometer (MMS). The measured detection threshold for charged particles with a delta-doped CCD has been extended down to 700 eV, representing over an order of magnitude improvement compared to conventional solid-state detectors. We report the direct detection of 700 eV energy ions by the mass spectral measurements of species such as iron pentacarbonyl. The combination of delta-doped CCD and MMS enables high-speed, precision mass spectrometry of ions and molecules on a small scale suitable for field and space applications.
机译:增量掺杂的电荷耦合器件(CCD)用于同时和直接检测沿着微型质谱仪(MMS)焦平面散布的低能原子和分子离子。具有增量掺杂CCD的带电粒子的测量检测阈值已扩展至700 eV,与传统的固态检测器相比,提高了一个数量级。我们报告了通过物种(例如五羰基铁)的质谱测量直接检测到700 eV能量离子。 δ掺杂CCD和MMS的组合可实现小规模的离子和分子的高速精密质谱分析,适用于野外和太空应用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号