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Photogalvanic effects for interband transition in p-Si_(0.5)Ge_(0.5)/Si multiple quantum wells

机译:p-Si_(0.5)Ge_(0.5)/ Si多量子阱中带间跃迁的光电流效应

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摘要

Circular photogalvanic effect (CPGE) and linear photogalvanic effect for interband transition have been observed simultaneously in Si_(0.5)Ge_(0.5)/Si multiple quantum wells. The signature of the CPGE is evidenced by the change of its sign upon reversing the radiation helicity. It is found that the observed CPGE photocurrent is an order of magnitude greater than that obtained for intersubband transition. The dependences of the CPGE on the angle of incidence and the excitation intensities can be well interpreted based on its characteristics. The large signal of spin generation observed here at room temperature should be very useful for the realization of practical application of spintronics.
机译:在Si_(0.5)Ge_(0.5)/ Si多量子阱中同时观察到了带间跃迁的圆形光电效应(CPGE)和线性光电效应。 CPGE的签名通过逆转辐射螺旋度时其符号的变化来证明。发现所观察到的CPGE光电流比子带间过渡所获得的光电流大一个数量级。基于CPGE的特性,可以很好地解释CPGE对入射角和激发强度的依赖性。在室温下观察到的自旋产生的大信号对于实现自旋电子学的实际应用非常有用。

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