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Self-annihilation of electron-irradiation-induced defects in InAs_xp_(1-X)/InP multiquantum well solar cells

机译:InAs_xp_(1-X)/ InP多量子阱太阳能电池中电子辐照引起的缺陷的自an灭

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摘要

Irradiation by 1 MeV electron of InAs_xP_(1-x)/InP multiquantum well (MQW) solar cells results in the appearance of a dominant electron-emitting level E1, in the upper half of the band gap. The level E1, however, exhibits an interesting behavior as it was found to completely anneal out with storage at room temperature with no change in other majority carrier levels. No any other defect has been observed in electron-irradiated n-type InAs_xP_(1-x)/InP MQW solar cell structures, which contrasts to conventional n-InP solar cell counterparts (structures without QWs). The study reveals that introduction of QWs in the intrinsic region of p-i-n structures enhances significantly the device radiation tolerance well beyond what has been thus far reported for conventional Si or Ⅲ-Ⅴ semiconductor-based solar cells.
机译:1 MeV电子对InAs_xP_(1-x)/ InP多量子阱(MQW)太阳能电池的照射导致在带隙的上半部出现主要的电子发射能级E1。然而,水平E1表现出有趣的行为,因为发现其在室温下与储存完全退火,而其他多数载流子水平没有变化。在电子辐照的n型InAs_xP_(1-x)/ InP MQW太阳能电池结构中未发现任何其他缺陷,这与常规的n-InP太阳能电池对应物(无QW的结构)形成了对比。研究表明,在p-i-n结构的本征区域引入QWs大大提高了器件的辐射耐受性,远远超出了迄今为止基于常规Si或Ⅲ-Ⅴ半导体基太阳能电池的报道。

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