首页> 外文期刊>Applied Physicsletters >Omnidirectional Photonic Bandgaps In Porous Silicon Based Mirrors With A Gaussian Profile Refractive Index
【24h】

Omnidirectional Photonic Bandgaps In Porous Silicon Based Mirrors With A Gaussian Profile Refractive Index

机译:具有高斯轮廓折射率的多孔硅基镜中的全向光子带隙

获取原文
获取原文并翻译 | 示例
       

摘要

We have designed and fabricated one dimensional photonic bandgap (PBG) structures from dielectric multilayers of porous silicon, with a periodic repetition of a unit cell consisting of 21 layers (95%) with the refractive index varying according to the envelope of a Gaussian function and another layer (5%) with a fixed refractive index. The structures can be designed to demonstrate the wavelength scalability within the visible as well as near infrared region. Three different structures have been stacked together to enhance the width of the PBG. The omnidirectional nature of the PBG was verified experimentally and theoretically up to 68° and 89° angles of incidence, respectively.
机译:我们已经从多孔硅的电介质多层中设计和制造了一维光子带隙(PBG)结构,并周期性重复了由21层(95%)组成的晶胞,其折射率根据高斯函数的包络和另一层(5%)具有固定的折射率。可以将结构设计为展示可见光区域和近红外区域内的波长可伸缩性。三种不同的结构已堆叠在一起以增加PBG的宽度。 PBG的全向特性分别在高达68°和89°的入射角下进行了实验和理论验证。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号