机译:SrTiO_3 / LaVO_3外延异质结构的电容电压特性
Department of Materials Science and Engineering, University of California, Berkeley, California 94720, USA Samsung Advanced Institute of Technology, Samsung Electronics, Yongin, Gyeonggi 446-712, Republic of Korea;
rnSamsung Advanced Institute of Technology, Samsung Electronics, Yongin, Gyeonggi 446-712, Republic of Korea;
rnDepartment of Materials Science and Engineering, University of California, Berkeley, California 94720, USA School of Materials Engineering, School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA;
机译:SrTiO_3厚度对(La,Sr)CoO_3 /(Pb,La)(Zr,Ti)O_3 / SrTiO_3 / LaVO_3外延异质结构的电容电压特性的影响
机译:BiFeO_3 / CeO_2 /氧化锆稳定的氧化锆/ Si(001)异质结构的外延生长和电容电压特性
机译:LaVO_3外延应变下的相图:对SrTiO_3和LaAlO_3衬底上生长的薄膜的影响
机译:铁电场效应存储器件的外延钙钛矿LaVO_3 /(Ba,Sr)TiO_3 /(Pb,La)(Zr,Ti)O_3 /(La,Sr)CoO_3异质结构
机译:与Si(100)集成的VO2 / NiO外延异质结构的半导体到金属的跃迁特性。
机译:溶液处理半导体碳纳米管网络制造的薄膜晶体管的电容-电压特性
机译:LaVO_3 / srTiO_3界面的极性不连续掺杂