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Nonvolatile memory characteristics of organic thin film transistors using poly(2-hydroxyethyl methacrylate)-based polymer multilayer dielectric

机译:基于聚(甲基丙烯酸2-羟乙酯)聚合物多层电介质的有机薄膜晶体管的非易失性存储特性

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摘要

A wide hysteresis width characteristic (memory window) was observed in the organic thin film transistors (OTFTs) using poly(2-hydroxyethyl methacrylate) (PHEMA)-based polymer multilayers. In this study, a strong memory effect was also found in the pentacene-based OTFTs and the electric characteristics were improved by introducing PHEMA/poly(methyl methacrylate) (PMMA)/PHEMA trilayer to replace the conventional PHEMA monolayer or PMMA/PHEMA and PHEMA/PMMA bilayer as the dielectric layers of OTFTs. The memory effect was originated from the electron trapping and slow polarization of the dielectrics. The hydroxyl (-OH) groups inside the polymer dielectric were the main charge storage sites of the electrons. This charge-storage phenomenon could lead to a wide flat-band voltage shift (memory window, AVpb = 22 V) which is essential for the OTFTs' memory-related applications. Moreover, the fabricated transistors also exhibited significant switchable channel current due to the charge-storage and slow charge relaxation.
机译:在使用基于聚(甲基丙烯酸2-羟乙酯)(PHEMA)的聚合物多层薄膜的有机薄膜晶体管(OTFT)中,观察到了较宽的磁滞宽度特性(内存窗口)。在这项研究中,在并五苯基OTFT中也发现了很强的记忆效应,并且通过引入PHEMA /聚甲基丙烯酸甲酯(PMMA)/ PHEMA三层代替常规的PHEMA单层或PMMA / PHEMA和PHEMA改善了电特性。 / PMMA双层作为OTFT的介电层。记忆效应源自电介质的电子俘获和慢极化。聚合物电介质中的羟基(-OH)是电子的主要电荷存储位点。这种电荷存储现象可能导致宽频带的电压漂移(存储器窗口,AVpb = 22 V),这对于OTFT的存储器相关应用至关重要。此外,由于电荷存储和缓慢的电荷弛豫,所制造的晶体管还表现出显着的可切换沟道电流。

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  • 来源
    《Applied Physics Letters》 |2011年第14期|p.289-291|共3页
  • 作者单位

    Institute of Microelectronics and Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan;

    Institute of Microelectronics and Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan,Department of Electrical Engineering, Run Shan University, Tainan 710, Taiwan;

    Institute of Microelectronics and Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan;

    Department of Applied Science, National Taitung University, Taitung 950, Taiwan;

    Institute of Microelectronics and Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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