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Ferromagnetism in C-doped SnO_2 thin films

机译:碳掺杂SnO_2薄膜中的铁磁性

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Room temperature ferromagnetism (FM) was observed in laser ablated C-doped SnO_2 thin films grown on LaAlO_3 substrates. The greatest value of the saturated magnetization (at 1 T) is found in SnO_2 films doped with 1% of C (about 16 emu/cm~3) and reduces lightly as the C concentration increases. By subtracting the base of pure SnO_2 that is also magnetic, one can find that C-doping actually enhances ferromagnetism in the host SnO_2. It suggests that carbon really causes defect-induced magnetism of about 3.91 μb/C into SnO_2. Measurements on C-doped SnO_2 bulks show that the observed properties are unique for films (lower dimensions, having surface/interface effect). The investigation on thickness dependence shows a change in magnetization when going from thin to thick films, implying that somehow if magnetism is due to defects then those must be located more on or near the surface than in deeper layers. Anisotropy is also observed, enforcing the assumption for the origin of magnetism due to defects in C-doped SnO_2.
机译:在生长在LaAlO_3衬底上的激光烧蚀C掺杂SnO_2薄膜中观察到室温铁磁(FM)。在掺有1%C的SnO_2薄膜中(约16 emu / cm〜3)发现饱和磁化强度的最大值(在1 T处),并且随着C浓度的增加而减小。通过减去也具有磁性的纯SnO_2的基数,可以发现C掺杂实际上增强了主体SnO_2中的铁磁性。这表明碳确实将缺陷诱导的磁化强度变成3.91μb/ C进入SnO_2。对C掺杂的SnO_2块的测量表明,所观察到的性能对于薄膜是独特的(较小尺寸,具有表面/界面效应)。对厚度依赖性的研究表明,当从薄膜到厚膜时,磁化强度发生了变化,这意味着如果某种原因是磁性是由缺陷引起的,那么那些缺陷必须位于表面上或表面附近,而不是位于更深层中。还观察到各向异性,从而加强了对由于C掺杂SnO_2中的缺陷引起的磁性起源的假设。

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  • 来源
    《Applied Physics Letters》 |2011年第5期|p.052505.1-052505.3|共3页
  • 作者单位

    Nanomagnetism Laboratory, Department of Physics and Astronomy, Seoul National University, Seoul 151-747, South Korea;

    Nanomagnetism Laboratory, Department of Physics and Astronomy, Seoul National University, Seoul 151-747, South Korea;

    Nanomagnetism Laboratory, Department of Physics and Astronomy, Seoul National University, Seoul 151-747, South Korea;

    Department of Physics, Graduate School of Science and Engineering Ehime University, Matsuyama 790-8577, Japan;

    Department of Physics, Graduate School of Science and Engineering Ehime University, Matsuyama 790-8577, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:18:05

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