...
首页> 外文期刊>Applied Physics Letters >Vacancy induced metallicity at the CaHfO_3/SrTiO_3 interface
【24h】

Vacancy induced metallicity at the CaHfO_3/SrTiO_3 interface

机译:CaHfO_3 / SrTiO_3界面处空位诱导的金属性

获取原文
获取原文并翻译 | 示例

摘要

Density functional theory is used to study the electronic properties of the oxide heterointerface CaHfO_3/SrTiO_3. Structural relaxation is carried out with and without O vacancies. As compared to related interfaces, strongly reduced octahedral distortions are found. Stoichiometric interfaces between the wide band gap insulators CaHfO_3 and SrTiO_3 turn out to exhibit an insulating state. However, interface metallicity is introduced by O vacancies, in agreement with experiment. The reduced octahedral distortions and necessity of O deficiency indicate a less complicated mechanism for the creation of the interfacial electron gas.
机译:密度泛函理论用于研究氧化物异质界面CaHfO_3 / SrTiO_3的电子性质。在有和没有O空位的情况下进行结构松弛。与相关接口相比,发现大大降低了八面体变形。宽带隙绝缘体CaHfO_3和SrTiO_3之间的化学计量界面被证明表现出绝缘状态。然而,与实验一致,O空位引入了界面金属性。减少的八面体形变和O缺乏的必要性表明界面电子气生成的机理不太复杂。

著录项

  • 来源
    《Applied Physics Letters 》 |2011年第13期| p.133114.1-133114.3| 共3页
  • 作者单位

    Physical Science and Engineering Division, KAUST, Thuwal 23955-6900, Saudi Arabia;

    Physical Science and Engineering Division, KAUST, Thuwal 23955-6900, Saudi Arabia;

    Physical Science and Engineering Division, KAUST, Thuwal 23955-6900, Saudi Arabia;

    Physical Science and Engineering Division, KAUST, Thuwal 23955-6900, Saudi Arabia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号