机译:太赫兹检测器的场效应晶体管的性能极限
Rensselaer Polytechnic Institute, 110, 8th Street, Troy, New York 12180, USA,A.F. Ioffe Physical-Technical Institute, 26 Politechnicheskaya Street, St. Petersburg 194021, Russia;
Rensselaer Polytechnic Institute, 110, 8th Street, Troy, New York 12180, USA,A.F. Ioffe Physical-Technical Institute, 26 Politechnicheskaya Street, St. Petersburg 194021, Russia,Laboratoire Charles Coulomb & TERALAB, Universite Montpellier 2 & CNRS, 34950 Montpellie, France;
Laboratoire Charles Coulomb & TERALAB, Universite Montpellier 2 & CNRS, 34950 Montpellie, France;
Rensselaer Polytechnic Institute, 110, 8th Street, Troy, New York 12180, USA;
机译:应变硅调制掺杂的场效应晶体管,作为太赫兹和亚太赫兹辐射的检测器
机译:未冷却的检测器挑战:毫米波和太赫兹长通道场效应晶体管和肖特基势垒二极管检测器
机译:基于现场效应晶体管的太赫兹探测器的时间分辨率和动态范围
机译:太赫兹等离子体场效应晶体管探测器的物理极限
机译:用于太赫兹检测的数字和紧凑型场效应晶体管模型经过验证
机译:硅场效应晶体管作为太赫兹自动曲线仪的非线性检测器
机译:场效应晶体管作为太赫兹探测器的性能限制