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Josephson effects in an alternating current biased transition edge sensor

机译:约瑟夫森效应在交流偏置过渡边缘传感器中的作用

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摘要

We report the experimental evidence of the ac Josephson effect in a transition edge sensor (TES) operating in a frequency domain multiplexer and biased by ac voltage at MHz frequencies. The effect is observed by measuring the non-linear impedance of the sensor. The TES is treated as a weakly linked superconducting system and within the resistively shunted junction model framework. We provide a full theoretical explanation of the results by finding the analytic solution of the non-inertial Langevian equation of the system and calculating the non-linear response of the detector to a large ac bias current in the presence of noise.
机译:我们报告了在频域多路复用器中工作的过渡边缘传感器(TES)中的交流约瑟夫森效应的实验证据,并受到了MHz频率的交流电压的偏置。通过测量传感器的非线性阻抗可以观察到这种影响。 TES被视为弱连接的超导系统,并且在电阻分流结模型框架内。通过找到系统的非惯性Langevian方程的解析解并计算在存在噪声的情况下检测器对大交流偏置电流的非线性响应,我们为结果提供了完整的理论解释。

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  • 来源
    《Applied Physics Letters》 |2014年第16期|162605.1-162605.4|共4页
  • 作者单位

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    Department of Physics, Lancaster University, LA1 4YB Lancaster, United Kingdom;

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    Department of Physics, Lancaster University, LA1 4YB Lancaster, United Kingdom;

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

    Faculty of Applied Sciences, Kavli Institute of NanoScience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands,SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:16:06

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