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Tunability of conduction at the LaAlO_3/SrTiO_3 heterointerface: Thickness and compositional studies

机译:LaAlO_3 / SrTiO_3异质界面上的导电可调性:厚度和成分研究

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摘要

The role of chemistry, film thickness, and oxygen pressure in influencing the electrical and thermal transport properties of LaAlO_3/SrTiO_3 heterointerfaces is explored. Unit-cell precise growth was accomplished for films between 3 and 160 unit cells thick using reflection high-energy electron diffraction-assisted pulsed-laser deposition. Subsequent temperature-dependent studies of electrical resistivity reveal three important observations: (1) by tuning the laser fluence, we can systematically tune the interfacial conductance in a step-wise manner in this system, (2) all films exhibit a critical thickness of 3-4 unit cells for the onset of conduction, and (3) the nature of the conductance is highly influenced by the stoichiometry of the LaAlO_3 film with La-deficient samples showing dramatic changes with thickness, while stoichiometric and La-excess films show little dependence. Time-domain thermoreflectance studies show a diminished interfacial thermal conductance for the La-deficient films when compared to La-excess and stoichiometric films, suggesting that the interfacial conductance is more influenced by extrinsic factors such as oxygen deficiency.
机译:探索了化学,膜厚度和氧气压力在影响LaAlO_3 / SrTiO_3异质界面的电和热输运性质中的作用。使用反射高能电子衍射辅助脉冲激光沉积技术,可以对3到160个单位晶格之间的膜实现单位晶格的精确生长。随后的电阻率随温度变化的研究揭示了三个重要的观察结果:(1)通过调节激光能量密度,我们可以在该系统中以逐步的方式系统地调整界面电导,(2)所有薄膜的临界厚度均为3 -4个单位晶格用于传导的开始,以及(3)电导的性质受LaAlO_3薄膜化学计量的影响,其中La缺乏样品的厚度随厚度发生显着变化,而化学计量薄膜和La过量的薄膜几乎没有依赖性。时域热反射研究表明,与La过量薄膜和化学计量薄膜相比,La缺陷薄膜的界面导热减小了,这表明界面电导更受外部因素(例如氧气缺乏)的影响。

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  • 来源
    《Applied Physics Letters》 |2014年第12期|121610.1-121610.5|共5页
  • 作者单位

    Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois, Urbana-Champaign, Urbana, Illinois 81801, USA, Materials Science and Technology Division, Code 6364, Naval Research Laboratory, Washington, DC 20375, USA;

    Department of Physics and Materials Research Laboratory, University of Illinois, Urbana-Champaign, Urbana, Illinois 61801, USA, IBM T. J. Watson Research Center, Yorktown, Heights, New York 10598, USA;

    Department of Physics and Materials Research Laboratory, University of Illinois, Urbana-Champaign, Urbana, Illinois 61801, USA;

    Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, California 94720, USA, Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:16:01

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