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Reading data stored in the state of metastable defects in silicon using band-band photoluminescence: Proof of concept and physical limits to the data storage density

机译:使用波段光致发光读取存储在硅中的亚稳态缺陷状态下的数据:概念证明和数据存储密度的物理限制

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摘要

The state of bistable defects in crystalline silicon such as iron-boron pairs or the boron-oxygen defect can be changed at room temperature. In this letter, we experimentally demonstrate that the chemical state of a group of defects can be changed to represent a bit of information. The state can then be read without direct contact via the intensity of the emitted band-band photoluminescence signal of the group of defects, via their impact on the carrier lifetime. The theoretical limit of the information density is then computed. The information density is shown to be low for two-dimensional storage but significant for three-dimensional data storage. Finally, we compute the maximum storage capacity as a function of the lower limit of the photoluminescence detector sensitivity.
机译:晶体硅中的双稳态缺陷(例如铁-硼对或硼-氧缺陷)的状态可以在室温下改变。在这封信中,我们通过实验证明了一组缺陷的化学状态可以更改以表示一些信息。然后可以通过缺陷组对载流子寿命的影响,通过发射的缺陷组的波段光致发光信号的强度,在没有直接接触的情况下读取状态。然后计算信息密度的理论极限。对于二维存储,信息密度显示为低,但对于三维数据存储,信息密度则显着。最后,我们将最大存储容量计算为光致发光检测器灵敏度下限的函数。

著录项

  • 来源
    《Applied Physics Letters》 |2014年第12期|124103.1-124103.3|共3页
  • 作者

    F. E. Rougieux; D. Macdonald;

  • 作者单位

    Research School of Engineering, College of Engineering and Computer Science, The Australian National University, Canberra, ACT 0200, Australia;

    Research School of Engineering, College of Engineering and Computer Science, The Australian National University, Canberra, ACT 0200, Australia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 03:15:45

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