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Transmission secondary ion mass spectrometry using 5 MeV C_(60)~+ ions

机译:使用5 MeV C_(60)〜+离子的透射二次离子质谱

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摘要

In the secondary ion mass spectrometry (SIMS), use of cluster ions has an advantage of producing a high sensitivity of intact large molecular ions over monatomic ions. This paper presents further yield enhancement of the intact biomolecular ions by measuring the secondary ions emitted in the forward direction. Phenylalanine amino acid films deposited on self-supporting thin Si_3N_4 films were bombarded with 5 MeV C_(60) ions. Secondary ions emitted in the forward and backward directions were measured. The yield of intact phenylalanine molecular ions emitted in the forward direction is significantly enhanced compared to the backward direction while fragment ions are suppressed. This suggests a large potential of using transmission cluster ion SIMS for the analysis of biological materials.
机译:在二次离子质谱仪(SIMS)中,簇离子的使用具有产生完整大分子离子比单原子离子高灵敏度的优点。本文通过测量正向发射的次级离子,进一步提高了完整生物分子离子的产量。用5 MeV C_(60)离子轰击沉积在自支撑Si_3N_4薄膜上的苯丙氨酸氨基酸薄膜。测量在向前和向后方向上发射的次级离子。与反向相比,向前方向发射的完整苯丙氨酸分子离子的产率显着提高,而碎片离子受到抑制。这表明使用传输簇离子SIMS进行生物材料分析的巨大潜力。

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  • 来源
    《Applied Physics Letters》 |2014年第11期|114103.1-114103.4|共4页
  • 作者单位

    Department of Micro Engineering, Kyoto University, Kyoto 615-8540, Japan;

    Department of Micro Engineering, Kyoto University, Kyoto 615-8540, Japan;

    Department of Micro Engineering, Kyoto University, Kyoto 615-8540, Japan;

    Takasaki Advanced Radiation Research Institute, Japan Atomic Energy Agency, 1233 Watanuki-machi, Takasaki, Gumma 370-1292, Japan;

    Takasaki Advanced Radiation Research Institute, Japan Atomic Energy Agency, 1233 Watanuki-machi, Takasaki, Gumma 370-1292, Japan;

    National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan;

    Department of Micro Engineering, Kyoto University, Kyoto 615-8540, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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