Non-contact bimodal magnetic force microscopy

摘要

A bimodal magnetic force microscopy technique optimized for lateral resolution and sensitivity for small magnetic stray fields is discussed. A double phase-locked loop (PLL) system is used to drive a high-quality factor cantilever under vacuum conditions on its first mode and simultaneously on its second mode. The higher-stiffness second mode is used to map the topography. The magnetic force is measured with the higher-sensitivity first oscillation mode.