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Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths

机译:晶体硅在近红外波长处的带间吸收系数的不确定性

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摘要

We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results.
机译:我们提供了在950 K至1350nm波长范围内295 K处晶体硅的带间吸收系数的数据,并分析了其不确定性。该数据是从反射率和透射率的测量值以及光谱解析的光致发光测量值和光谱响应测量值获得的。基于我们的设备的广泛特性,进行了严格的测量不确定度分析。我们确定在1000 nm处的相对不确定度为4%,在1200 nm处增加为22%,在1300 nm处增加为160%,并表明所有方法均产生可比较的结果。

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  • 来源
    《Applied Physics Letters》 |2014年第8期|081915.1-081915.4|共4页
  • 作者单位

    Institute for Solar Energy Research Hamelin (ISFH), Am Ohrberg 1, D-31860 Emmerthal, Germany;

    Institute for Solar Energy Research Hamelin (ISFH), Am Ohrberg 1, D-31860 Emmerthal, Germany;

    Institute for Solar Energy Research Hamelin (ISFH), Am Ohrberg 1, D-31860 Emmerthal, Germany;

    Institute for Solar Energy Research Hamelin (ISFH), Am Ohrberg 1, D-31860 Emmerthal, Germany;

    Institute for Solar Energy Research Hamelin (ISFH), Am Ohrberg 1, D-31860 Emmerthal, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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