...
首页> 外文期刊>Applied Physics Letters >Ion-induced dynamical change of supercurrent flow in superconducting strip ion detectors with parallel configuration
【24h】

Ion-induced dynamical change of supercurrent flow in superconducting strip ion detectors with parallel configuration

机译:平行配置超导带状离子检测器中离子流引起的超电流动态变化

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Superconducting strip ion detectors are promising for realizing ideal ion detection in time-of-flight mass spectrometry. To realize large sensitive area for practical use, parallel configurations of superconducting strips are mandatory. In a previous parallel configuration design, however, we have found that a non-negligible number of ion impact events were lost because a large number of output current pulses for single ions were fatally small. An alternative parallel configuration design has solved this critical problem. It has been revealed that ion impact events induce dynamical change of bias current flow among parallel superconducting strips. Furthermore, output current distributions of larger bias current have shown another dynamical phenomenon: multi-strip switching triggered by single ion impact.
机译:超导带状离子检测器有望在飞行时间质谱中实现理想的离子检测。为了实现大的实际使用敏感区域,必须平行配置超导条。但是,在以前的并行配置设计中,我们发现丢失了不可忽略的离子碰撞事件,因为单个离子的大量输出电流脉冲非常小。另一种并行配置设计解决了这个关键问题。已经发现,离子碰撞事件引起平行超导带之间的偏置电流流动的动态变化。此外,较大偏置电流的输出电流分布还显示出另一种动态现象:单离子碰撞触发多条开关。

著录项

  • 来源
    《Applied Physics Letters》 |2014年第1期|012601.1-012601.5|共5页
  • 作者单位

    National Institute of Advanced Industrial Science and Technology (AIST). Research Institute of Instrumentation Frontier (RIIF), 305-8568 Tsukuba, Japan;

    National Institute of Advanced Industrial Science and Technology (AIST). Research Institute of Instrumentation Frontier (RIIF), 305-8568 Tsukuba, Japan;

    National Institute of Advanced Industrial Science and Technology (AIST). Research Institute of Instrumentation Frontier (RIIF), 305-8568 Tsukuba, Japan;

    National Institute of Advanced Industrial Science and Technology (AIST). Research Institute of Instrumentation Frontier (RIIF), 305-8568 Tsukuba, Japan;

    National Institute of Advanced Industrial Science and Technology (AIST). Research Institute of Instrumentation Frontier (RIIF), 305-8568 Tsukuba, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号