Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

摘要

A dedicated transmission electron microscope sample holder has been used to study in situ the cold-field emission process of carbon cone nanotips (CCnTs). We show that when using a CCnT instead of a Au plate-anode, the standard deviation of the emission current noise can be decreased from the 10 nA range to the 1 nA range under vacuum conditions of 10~(-1)Pa. This shows the strong influence of the anode on the cold-field emission current noise.