Effects of the fluctuation in a singly-connected conducting filament structure on the distribution of the reset parameters in unipolar resistance switching

摘要

The reset current (I_(reset)), voltage (V_(reset)), and resistance of the low resistance state, as functions of the compliance current (CC), were investigated in a Pt/NiO/Pt structure that showed unipolar resistance switching. Interestingly, the I_(reset) and the V_(reset) measured at low CCs were found to be widely distributed. In order to explain the behavior of the reset parameters for the singly-connected conducting filament (CF) structure, a simple model of CFs was employed whose width variation follows the Gaussian distribution. The wide distribution of the reset parameters can be attributed to the fluctuation in the number and/or the width of the CFs.