Thermodynamic analysis of conductive filaments

摘要

We present a thermodynamic theory of the conductive filament growth and dissolution in random access memory describing the observed features of their current-voltage (Ⅳ) characteristics. Our theory is based on the self-consisted Fokker-Planck approach reducing the filament kinetics to its thermodynamics. Expressing the observed Ⅳ features through material parameters, our results pave a way to device improvements.