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Enhancing electrical conductivity of room temperature deposited Sn-doped ln_2O_3 thin films by hematite seed layers

机译:利用赤铁矿晶种层提高室温沉积的Sn掺杂ln_2O_3薄膜的电导率

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摘要

Hematite Fe2O3 seed layers are shown to constitute a pathway to prepare highly conductive transparent tin-doped indium oxide thin films by room temperature magnetron sputtering. Conductivities of up to sigma = 3300 S/cm are observed. The unproved conductivity is not restricted to the interface but related to an enhanced crystallization of the films, which proceeds in the rhombohedral phase. Published by AIP Publishing.
机译:示出了赤铁矿Fe 2 O 3种子层构成了通过室温磁控溅射制备高导电性透明掺杂锡的氧化铟薄膜的途径。观察到电导率高达sigma = 3300 S / cm。未经证实的电导率不仅限于界面,还与膜的结晶化有关,该结晶化在菱面体相中进行。由AIP Publishing发布。

著录项

  • 来源
    《Applied Physics Letters》 |2018年第15期|152105.1-152105.4|共4页
  • 作者单位

    Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany;

    Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany;

    Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany;

    Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany;

    Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany;

    Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 03:13:53

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