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Discrepancies between roughness measurements obtained with phase-shifting and white-light interferometry

机译:通过相移和白光干涉仪获得的粗糙度测量值之间的差异

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摘要

Discrepancies between phase-shifting and white-light interferometry have been observed in step-height and sur. face rodghness measurements. The discrepancies have a strong relation to the roughness average parameter of the surface. The skewing effect, which mainly occurs in the vicinity of peaks, valleys, and edges of the sample, catiges this problem in white-light interferometry of step height. For roughness, two possible sources of the discrepancy are considered.
机译:在步进高度和更高高度中已经观察到相移和白光干涉测量法之间的差异。面部僵硬度测量。差异与表面的粗糙度平均参数密切相关。偏斜效应主要发生在样品的峰,谷和边缘附近,在阶跃高度的白光干涉测量中解决了这个问题。对于粗糙度,考虑了两种可能的差异来源。

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