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首页> 外文期刊>IEEE Transactions on Advanced Packaging >Parameter extraction and electrical characterization of highdensity connector using time domain measurements
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Parameter extraction and electrical characterization of highdensity connector using time domain measurements

机译:使用时域测量对高密度连接器进行参数提取和电特性分析

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摘要

Two coupled connector pins can be represented by an equivalent circuit consisting of six parameters, namely, self capacitance/self inductance per pin, mutual capacitance between pins and mutual inductance between pins. A systematic parameter extraction algorithm has been discussed in this paper using time domain reflectometry (TDR) measurements. This method uses a combination of stand-alone, common mode, and differential mode measurements to extract the connector parasitics. The accuracy of the equivalent circuit has been studied in detail using crosstalk measurements
机译:两个耦合的连接器引脚可以用等效电路表示,该等效电路包含六个参数,即每个引脚的自电容/自感,引脚之间的互电容以及引脚之间的互感。本文讨论了一种使用时域反射法(TDR)测量的系统参数提取算法。此方法结合使用独立,共模和差模测量,以提取连接器寄生效应。已使用串扰测量对等效电路的精度进行了详细研究

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