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首页> 外文期刊>Advanced Materials >Low-Dimensional Structure Vacuum-Ultraviolet-Sensitive (lambda < 200 nm) Photodetector with Fast-Response Speed Based on High-Quality AlN Micro/Nanowire
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Low-Dimensional Structure Vacuum-Ultraviolet-Sensitive (lambda < 200 nm) Photodetector with Fast-Response Speed Based on High-Quality AlN Micro/Nanowire

机译:基于高质量AlN微米/纳米线的具有快速响应速度的低尺寸结构真空紫外敏感(λ<200 nm)光电探测器

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摘要

A low-dimensional-structure vacuum-ultraviolet-sensitive photodetector based on high-quality aluminum nitride (AlN) micro-anowires is reported. This work, for the first time, demonstrates that a semiconductor nanostructure can be applied in vacuum-ultraviolet (VUV) photon detection and opens a way for developing diminutive, power-saving, and low-cost VUV materials and sensors that can be potentially applied in geospace sciences and solar-terrestrial physics.
机译:报道了一种基于高质量氮化铝(AlN)微/纳米线的低维结构真空紫外敏感光电探测器。这项工作首次证明了半导体纳米结构可以应用于真空紫外(VUV)光子检测,并为开发小型,节能和低成本的VUV材料和传感器开辟了途径在地球空间科学和太阳地面物理学领域。

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  • 来源
    《Advanced Materials》 |2015年第26期|3921-3927|共7页
  • 作者单位

    Sun Yat Sen Univ, Sch Phys & Engn, State Key Lab Optoelect Mat & Technol, Guangzhou 510275, Guangdong, Peoples R China;

    Sun Yat Sen Univ, Sch Phys & Engn, State Key Lab Optoelect Mat & Technol, Guangzhou 510275, Guangdong, Peoples R China;

    Shenzhen Univ, Key Lab Optoelect Devices & Syst, Minist Educ, Shenzhen 518060, Peoples R China|Shenzhen Univ, Guangdong Prov Inst Optoelect, Shenzhen 518060, Peoples R China;

    Shenzhen Univ, Key Lab Optoelect Devices & Syst, Minist Educ, Shenzhen 518060, Peoples R China|Shenzhen Univ, Guangdong Prov Inst Optoelect, Shenzhen 518060, Peoples R China;

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