首页> 外文期刊>Advanced Functional Materials >Tunable Low-Field Magnetoresistance in (La_(0.7)Sr_(0.3)MnO_3)_(0.5):(ZnO)_(0.5) Self-Assembled Vertically Aligned Nanocomposite Thin Films
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Tunable Low-Field Magnetoresistance in (La_(0.7)Sr_(0.3)MnO_3)_(0.5):(ZnO)_(0.5) Self-Assembled Vertically Aligned Nanocomposite Thin Films

机译:(La_(0.7)Sr_(0.3)MnO_3)_(0.5):( ZnO)_(0.5)自组装垂直排列的纳米复合薄膜中的可调低场磁阻

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摘要

Tunable and enhanced low-field magnetoresistance (LFMR) is observed in epitaxial (La_(0.7)Sr_(0.3)Mn0_3)_(0.5):(ZnO)_(0.5)(LSMO:ZnO) self-assembled vertically aligned nanocomposite (VAN) thin films, which have been grown on SrTiO_3 (001) substrates by pulsed laser deposition (PLD). The enhanced LFMR properties of the VAN films reach values as high as 17.5% at 40 K and 30% at 154 K. They can be attributed to the spin-polarized tunneling across the artificial vertical grain boundaries (GBs) introduced by the secondary ZnO nanocolumns and the enhancement of spin fluctuation depression at the spin-disordered phase boundary regions. More interestingly, the vertical residual strain and the LFMR peak position of the VAN films can be systematically tuned by changing the deposition frequency. The tunability of the physical properties is associated with the vertical phase boundaries that change as a function of the deposition frequency. The results suggest that the tunable artificial vertical GB and spin-disordered phase boundary in the unique VAN system with vertical ferromagnetic-insulating-ferromagnetic (FM-I-FM) structure provides a viable route to manipulate the low-field magnetotransport properties in VAN films with favorable epitaxial quality.
机译:自组装垂直排列纳米复合材料(La_(0.7)Sr_(0.3)Mn0_3)_(0.5):( ZnO)_(0.5)(LSMO:ZnO)自组装垂直排列的纳米复合材料中观察到可调谐和增强的低场磁阻(LFMR) )薄膜,这些薄膜是通过脉冲激光沉积(PLD)在SrTiO_3(001)衬底上生长的。 VAN薄膜的增强的LFMR特性在40 K时达到17.5%的值,在154 K时达到30%的值。这可以归因于第二个ZnO纳米柱引入的穿过人工垂直晶界(GB)的自旋极化隧穿。以及在自旋无序的相边界区域处自旋波动抑制的增强。更有趣的是,可以通过改变沉积频率来系统地调节VAN膜的垂直残余应变和LFMR峰值位置。物理性质的可调性与垂直相位边界相关,该垂直相位边界根据沉积频率而变化。结果表明,在具有垂直铁磁绝缘铁磁(FM-I-FM)结构的独特VAN系统中,可调节的人工垂直GB和自旋无序相边界提供了一条可行的途径来控制VAN薄膜的低场磁传输特性具有良好的外延质量。

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  • 来源
    《Advanced Functional Materials》 |2011年第13期|p.2423-2429|共7页
  • 作者单位

    Department of Electrical and Computer Engineering Texas A&M University College Station, TX 77843, USA;

    Department of Electrical and Computer Engineering Texas A&M University College Station, TX 77843, USA;

    Department of Electrical and Computer Engineering Texas A&M University College Station, TX 77843, USA;

    Department of Electrical and Computer Engineering Texas A&M University College Station, TX 77843, USA;

    Department of Electrical and Computer Engineering Texas A&M University College Station, TX 77843, USA;

    Department of Mechanical Engineering Texas A&M University College Station, TX 77843, USA;

    Center for Integrated Nanotechnologies (CINT) Los Alamos National Laboratory Los Alamos, NM, 87545, USA;

    Department of Materials Science and Metallurgy University of Cambridge Pembroke Street, Cambridge, CB2 3QZ, UK;

    Department of Electrical and Computer Engineering Texas A&M University College Station, TX 77843, USA;

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