DEFECT PROFILE INDUCED BY FRICTION AND WEAR PROCESSES DETECTED BY POSITRON ANNIHILATION METHOD

摘要

The positron annihilation studies of defect profile in Cu samples whose surfaces were exposed to the friction and wear processes are presented. The values of the S-parameter and its dependences on the depth from the Cu surface are the functions of the value of the load applied in the sliding contact between two metals. It indicates possibilities of applying the presented measurement method in the industry.