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首页> 外文期刊>Acta Physica Polonica >Properties of Ultra Fast Deposited Diamond-Like Hydrogenated Carbon Films
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Properties of Ultra Fast Deposited Diamond-Like Hydrogenated Carbon Films

机译:超快沉积类金刚石氢化碳膜的性能

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Hydrogenated amorphous carbon films with diamond like structures have been formed on different substrates at very low energies and temperatures by a plasma enhanced chemical vapor deposition process employing acetylene as the precursor gas. The plasma source was of a cascaded arc type with Ar as carrier gas. The films were grown at very high deposition rates. Deposition on Si, glass and plastic substrates has been studied and the films characterized in terms of sp~3 content, roughness, hardness, adhesion and optical properties. Deposition rates up to 20 nm/s have been achieved at substrate temperatures below 100 ℃. The typical sp~3 content of 60-75% in the films was determined by X-ray generated Auger electron spectroscopy. Hardness, reduced modulus and adhesion were measured using a MicroMaterials Nano Test Indenter/Scratch tester. Hardness was found to vary from 4 to 13 GPa depending on deposition conditions. Adhesion was significantly influenced by the substrate temperature and in situ DC cleaning. Hydrogen content in the film was measured by a combination of the Fourier transform infrared and Rutherford backscattering techniques. Advantages of these films are: low ion energy and deposition temperature, very high deposition rates, low capital cost of the equipment and the possibility of film properties being tailored according to the desired application.
机译:通过使用乙炔作为前驱体气体的等离子体增强化学气相沉积工艺,已经在不同的基板上以非常低的能量和温度形成了具有类金刚石结构的氢化非晶碳膜。等离子体源是级联弧型的,其中Ar作为载气。薄膜以非常高的沉积速率生长。研究了在硅,玻璃和塑料基板上的沉积,并根据sp〜3含量,粗糙度,硬度,附着力和光学性能对薄膜进行了表征。在低于100℃的衬底温度下,沉积速率高达20 nm / s。通过X射线产生的俄歇电子能谱法确定薄膜中典型的sp〜3含量为60-75%。使用MicroMaterials Nano Test Indenter / Scratch测试仪测量硬度,降低的模量和附着力。发现硬度根据沉积条件在4至13GPa之间变化。粘附力受基材温度和原位DC清洗的影响很大。膜中的氢含量通过傅里叶变换红外和卢瑟福反向散射技术的结合进行测量。这些薄膜的优点是:离子能量和沉积温度低,沉积速率非常高,设备的投资成本低以及可以根据所需应用定制薄膜性能的可能性。

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