Grain boundary strengthening of copper-base copper-manganese and copper-gallium solid solutions

摘要

The yield strength σy of copper-base copper-manganese and copper-gallium polycrystalline solid solutions has been measured as a function of the grain size d. X-ray diffraction studies proved that the specimens had only very weak textures. The function σy(d) is well represented by the Hall-Petch re- lation, but its slope k varies strongly with the type and the concentration of the solute. That indicates that solid solution and grain boundary strengthening do not superimpose linearly.