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A Survey on Post-Silicon Functional Validation for Multicore Architectures

机译:多核架构的硅后功能验证调查

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During a processor development cycle, post-silicon validation is performed on the first fabricated chip to detect and fix design errors. Design errors occur due to functional issues when a unit in a design does not meet its specification. The chances of occurrence of such errors are high when new features are added in a processor. Thus, in multicore architectures, with new features being added in core and uncore components, the task of verifying the functionality independently and in coordination with other units gains significance. Several new techniques are being proposed in the field of functional validation. In this article, we undertake a survey of these techniques to identify areas that need to be addressed for multicore designs. We start with an analysis of design errors in multicore architectures. We then survey different functional validation techniques based on hardware, software, and formal methods and propose a comprehensive taxonomy for each of these approaches. We also perform a critical analysis to identify gaps in existing research and propose new research directions for validation of multicore architectures.
机译:在处理器开发周期中,在第一个制造的芯片上执行硅后验证,以检测和修复设计错误。当设计中的单元不符合其规格时,由于功能问题而发生设计错误。当在处理器中添加新功能时,发生此类错误的机会很高。因此,在多核体系结构中,在核心和非核心组件中添加了新功能后,独立验证功能并与其他单元协同工作的任务就变得很重要。在功能验证领域中提出了几种新技术。在本文中,我们对这些技术进行了调查,以确定多核设计需要解决的领域。我们首先分析多核体系结构中的设计错误。然后,我们调查基于硬件,软件和形式方法的不同功能验证技术,并针对这些方法中的每一种提出全面的分类法。我们还进行了重要的分析,以找出现有研究中的差距,并提出新的研究方向以验证多核架构。

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