多核处理器硅后调试技术研究最新进展

摘要

针对多核处理器硅后调试技术进行综述和分析.首先,介绍了多核处理器硅后调试技术面临的困难,特别是非确定性错误带来的新挑战；然后,概括介绍了国内外多核处理器硅后调试研究的最新进展,并分析了已有方法存在的问题；最后,对多核处理器硅后调试研究热点和趋势进行了分析,并指出该领域未来可能的研究方向.%This paper surveyed the post-silicon debug of uncertain bugs in multi-core processor. Firstly, it presented the challenges of debugging multi-core processor, especially for uncertain bugs. Then, it introduced and analyzed the state-of-the-art solutions for post-silicon debug in detail. Furthermore, it discussed the advantages and disadvantages of the existing methods. Finally, it concluded the hot topics of the current research and also presented the future directions.