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Syndromes of the First and Second Branchial Arches Part 1: Embryology and Characteristic Defects

机译:第一和第二鳃拱的综合征第1部分:胚胎学和特征缺陷

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摘要

A variety of congenital syndromes affecting the face occur due to defects involving the first and second BAs. Radiographic evaluation of craniofacial deformities is necessary to define aberrant anatomy, plan surgical procedures, and evaluate the effects of craniofacial growth and surgical reconstructions. High-resolution CT has proved vital in determining the nature and extent of these syndromes. The radiologic evaluation of syndromes of the first and second BAs should begin first by studying a series of isolated defects: CL with or without CP, micrognathia, and EAC atresia, which compose the major features of these syndromes and allow more specific diagnosis. After discussion of these defects and the associated embryology, we proceed to discuss the VCFS, PRS, ACS, TCS, Stickler syndrome, and HFM.
机译:由于涉及第一和第二BAS的缺陷,发生影响面部的各种先天性综合征。颅面畸形的射线照相评估是确定异常解剖,计划外科手术,并评估颅面生长和手术重建的影响。高分辨率CT在确定这些综合征的性质和程度方面证明了至关重要。第一和第二个BAS的综合征的放射学评估应首先通过研究一系列分离的缺陷:Cl有或没有CP,MicroMathaTa和EAC atresia,这构成了这些综合征的主要特征并允许更具体的诊断。在讨论这些缺陷和相关胚胎学后,我们继续讨论VCFS,PRS,ACS,TCS,Stickler综合征和HFM。

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