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Removal Mechanism Investigation of Ultraviolet Induced Nanoparticle Colloid Jet Machining

机译:紫外线诱导纳米粒子胶体喷射加工的去除机理研究

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摘要

Ultraviolet induced nanoparticle colloid jet machining is a new ultra-precision machining technology utilizing the reaction between nanoparticles and the surface of the workpiece to achieve sub-nanometer ultra-smooth surface manufacturing without damage. First-principles calculations based on the density functional theory (DFT) were carried out to study the atomic material removal mechanism of nanoparticle colloid jet machining and a series of impacting and polishing experiments were conducted to verify the mechanism. New chemical bonds of Ti-O-Si were generated through the chemical adsorption between the surface adsorbed hydroxyl groups of the TiO2 cluster and the Si surface with the adsorption energy of at least −4.360 eV. The two Si-Si back bonds were broken preferentially and the Si atom was removed in the separation process of TiO2 cluster from the Si surface realizing the atomic material removal. A layer of adsorbed TiO2 nanoparticles was detected on the Si surface after 3 min of fixed-point injection of an ultraviolet induced nanoparticle colloid jet. X-ray photoelectron spectroscopy results indicated that Ti-O-Si bonds were formed between TiO2 nanoparticles and Si surface corresponding to the calculation result. An ultra-smooth Si workpiece with a roughness of Rq 0.791 nm was obtained by ultraviolet induced nanoparticle colloid jet machining.
机译:紫外诱导的纳米颗粒胶体喷射加工是一种利用纳米颗粒和工件表面之间的反应的新型超精密加工技术,以实现亚纳米超光滑表面制造而不会损坏。对基于密度官能理论(DFT)进行的第一原理计算以研究纳米粒子胶体喷射加工的原子材料去除机制,并进行一系列冲击和抛光实验以验证该机制。通过TiO2簇的表面吸附的羟基与Si表面之间的化学吸附产生Ti-O-Si的新化学键,其吸附能量为至少-4.360eV。优选地破碎两个Si-Si背键,并在从Si表面上实现原子材料去除的TiO2簇的分离过程中除去Si原子。在3分钟内注射紫外线诱导的纳米粒子胶体射流后,在Si表面上检测到一层吸附的TiO2纳米颗粒。 X射线光电子体光谱结果表明Ti-O-Si键在TiO 2纳米颗粒和Si表面之间形成对应于计算结果。通过紫外线诱导的纳米颗粒胶体喷射加工获得具有粗糙度的超光滑的Si工件,粗糙度为0.791nm。

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