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Dependence of the Magnetization Process on the Thickness of Fe

机译:磁化过程对Fe厚度的依赖性

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摘要

Fe–Pd magnetic shape-memory alloys are of major importance for microsystem applications due to their magnetically driven large reversible strains under moderate stresses. In this context, we focus on the synthesis of nanostructured Fe70Pd30 shape-memory alloy antidot array thin films with different layer thicknesses in the range from 20 nm to 80 nm, deposited onto nanostructured alumina membranes. A significant change in the magnetization process of nanostructured samples was detected by varying the layer thickness. The in-plane coercivity for the antidot array samples increased with decreasing layer thickness, whereas for non-patterned films the coercive field decreased. Anomalous coercivity dependence with temperature was detected for thinner antidot array samples, observing a critical temperature at which the in-plane coercivity behavior changed. A significant reduction in the Curie temperature for antidot samples with thinner layer thicknesses was observed. We attribute these effects to complex magnetization reversal processes and the three-dimensional magnetization profile induced by the nanoholes. These findings could be of major interest in the development of novel magnetic sensors and thermo-magnetic recording patterned media based on template-assisted deposition techniques.
机译:Fe-Pd磁性形状记忆合金对于显微系统应用的主要重要性是由于它们在中等应力下的磁力驱动的大型可逆菌株。在这种情况下,我们专注于合成具有不同层厚度的纳米结构Fe70PD30形状记忆合金反向阵膜,其范围为20nm至80nm,沉积在纳米结构氧化铝膜上。通过改变层厚度来检测纳米结构样品的磁化过程的显着变化。用于反向阵列样品的面内矫顽力随层厚度的降低而增加,而对于非图案化膜,矫顽场降低。对于较薄的反对导体阵列样品,检测到具有温度的异常矫顽力,观察到面内矫顽力的临界温度变化。观察到具有较薄层厚度的反向样品的静脉温度的显着降低。我们将这些效应归因于复杂的磁化反转过程和纳米孔诱导的三维磁化曲线。基于模板辅助沉积技术,这些发现可能对新型磁传感器和热磁性记录图案化介质的开发进行了重大兴趣。

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