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Simple Device to Measure Pressure Using the Stress Impedance Effect of Amorphous Soft Magnetic Thin Film

机译:使用无定形软磁薄膜的应力阻抗效果来测量压力的简单装置

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摘要

A simple micro-machined pressure sensor, based on the stress-impedance (SI) effect, was fabricated herein using typical micro-fabrication technologies. To sense pressure, a 1-µm thin, soft magnetic metallic film of FeSiB was sputtered and used as a diaphragm. Its electrical response (impedance change) was measured under pressure in a frequency band from 5 to 500 MHz. A lumped-element equivalent electric circuit was used to separate the impedance of the soft magnetic metal from other parasitic elements. The impedance change clearly depended on the applied pressure. It was also shown that the impedance change could be explained by a change in relative permeability, according to the theory of the SI effect. The radial stress in the diaphragm and the relative permeability exhibited a linear relationship. At a measurement frequency of 200 MHz, the largest sensor response, with a gauge factor of 385.7, was found. It was in the same order as the conventional sensors. As the proposed device is very simple, it has the potential for application as a cheap pressure sensor.
机译:基于应力阻抗(Si)效应的简单微机械压力传感器在本文中使用典型的微制造技术制造。为了感测压力,溅射1μm薄,软磁性金属薄膜并用作隔膜。其电响应(阻抗变化)在频带的压力下测量5至500MHz。用于将软磁金属与其他寄生元件的阻抗分离出一块元件等效电路。阻抗变化明确依赖于施加的压力。还表明,根据SI效应理论,可以通过相对渗透性的变化来解释阻抗变化。隔膜中的径向应力和相对渗透性表现出线性关系。在200MHz的测量频率下,发现了最大的传感器响应,规格因子为385.7。它与传统传感器的顺序相同。由于所提出的设备非常简单,它具有应用作为便宜的压力传感器的可能性。

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