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Deriving Optimized PID Parameters of Nano-Ag Colloid Prepared by Electrical Spark Discharge Method

机译:电火花法制备纳米银胶体的最佳PID参数

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摘要

Using the electrical spark discharge method, this study prepared a nano-Ag colloid using self-developed, microelectrical discharge machining equipment. Requiring no additional surfactant, the approach in question can be used at the ambient temperature and pressure. Moreover, this novel physical method of preparation produced no chemical pollution. This study conducted an in-depth investigation to establish the following electrical discharge conditions: gap electrical discharge, short circuits, and open circuits. Short circuits affect system lifespan and cause electrode consumption, resulting in large, non-nanoscale particles. Accordingly, in this study, research for and design of a new logic judgment circuit set was used to determine the short-circuit rate. The Ziegler–Nichols proportional–integral–derivative (PID) method was then adopted to find optimal PID values for reducing the ratio between short-circuit and discharge rates of the system. The particle size, zeta potential, and ultraviolet spectrum of the nano-Ag colloid prepared using the aforementioned method were also analyzed with nanoanalysis equipment. Lastly, the characteristics of nanosized particles were analyzed with a transmission electron microscope. This study found that the lowest ratio between short-circuit rates was obtained (1.77%) when PID parameters were such that K was 0.96, K was 5.760576, and K was 0.039996. For the nano-Ag colloid prepared using the aforementioned PID parameters, the particle size was 3.409 nm, zeta potential was approximately −46.8 mV, absorbance was approximately 0.26, and surface plasmon resonance was 390 nm. Therefore, this study demonstrated that reducing the short-circuit rate can substantially enhance the effectiveness of the preparation and produce an optimal nano-Ag colloid.
机译:本研究使用电火花放电方法,使用自行开发的微电火花加工设备制备了纳米银胶体。不需要额外的表面活性剂,所讨论的方法可以在环境温度和压力下使用。而且,这种新颖的物理制备方法没有产生化学污染。这项研究进行了深入的调查,以建立以下放电条件:间隙放电,短路和开路。短路会影响系统寿命并导致电极消耗,从而导致大的非纳米级颗粒。因此,在本研究中,使用了一种新的逻辑判断电路装置的研究和设计来确定短路率。然后采用Ziegler-Nichols比例积分微分(PID)方法来找到最佳PID值,以减小系统的短路率和放电率之间的比率。还使用纳米分析设备分析了使用上述方法制备的纳米银胶体的粒径,ζ电势和紫外光谱。最后,用透射电子显微镜分析了纳米颗粒的特性。该研究发现,当PID参数使得K为0.96,K为5.760576和K为0.039996时,短路率之间的比率最低(1.77%)。对于使用上述PID参数制备的纳米Ag胶体,粒径为3.409 nm,ζ电位约为-46.8 mV,吸光度约为0.26,表面等离子体共振为390 nm。因此,这项研究表明,降低短路率可以显着提高制剂的有效性并产生最佳的纳米银胶体。

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