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The Large-Scale Preparation and Optical Properties of MoS2/WS2 Vertical Hetero-Junction

机译:MoS2 / WS2垂直异质结的大规模制备和光学性质

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摘要

A variety of hetero-junctions can be constructed to form the basic structural units in the different optoelectronic devices, such as the photo-detectors, solar cells, sensors and light-emitting diodes. In our research, the large-area high-quality MoS /WS vertical hetero-junction are prepared by the two-step atmospheric pressure chemical vapor deposition (APCVD) methods and the dry transfer method, and the corresponding optimal reaction conditions of MoS /WS vertical hetero-junction are obtained. The morphology, composition and optical properties of MoS /WS vertical hetero-junction are systematically characterized by the optical microscopy, Raman spectroscopy, photoluminescence spectroscopy, atomic force microscopy and the field emission scanning electron microscopy. Compared to the mechanical transfer method, the MoS /WS vertical hetero-junction sample obtained by the APCVD and dry transfer methods have lower impurity content, cleaner interfaces and tighter interlayer coupling. Besides, the strong interlayer coupling and effective interlayer charge transfer of MoS /WS vertical hetero-junction are also further studied. The photoluminescence intensity of MoS /WS vertical hetero-junction is significantly reduced compared to the single MoS or WS material. In general, this research can help to achieve the large-scale preparation of various Van der Waals hetero-junctions, which can lay the foundation for the new application of optoelectronic devices.
机译:可以构造各种异质结,以形成不同光电器件中的基本结构单元,例如光电探测器,太阳能电池,传感器和发光二极管。在我们的研究中,通过两步大气压化学气相沉积(APCVD)法和干转移法制备了大面积高质量的MoS / WS垂直异质结,并提出了相应的MoS / WS最佳反应条件获得垂直异质结。通过光学显微镜,拉曼光谱,光致发光光谱,原子力显微镜和场发射扫描电子显微镜系统地表征了MoS / WS垂直异质结的形貌,组成和光学性质。与机械转移方法相比,通过APCVD和干转移方法获得的MoS / WS垂直异质结样品具有更低的杂质含量,更干净的界面和更紧密的层间耦合。此外,还进一步研究了MoS / WS垂直异质结的强层间耦合和有效的层间电荷转移。与单一MoS或WS材料相比,MoS / WS垂直异质结的光致发光强度显着降低。总的来说,这项研究可以帮助实现各种范德华异质结的大规模制备,这可以为光电器件的新应用奠定基础。

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