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Exploratory Study on the Methodology of Fast Imaging of Unilateral Stroke Lesions by Electrical Impedance Asymmetry in Human Heads

机译:电阻抗不对称性对人脑单侧中风病灶快速成像的方法学探索

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摘要

Stroke has a high mortality and disability rate and should be rapidly diagnosed to improve prognosis. Diagnosing stroke is not a problem for hospitals with CT, MRI, and other imaging devices but is difficult for community hospitals without these devices. Based on the mechanism that the electrical impedance of the two hemispheres of a normal human head is basically symmetrical and a stroke can alter this symmetry, a fast electrical impedance imaging method called symmetrical electrical impedance tomography (SEIT) is proposed. In this technique, electrical impedance tomography (EIT) data measured from the undamaged craniocerebral hemisphere (CCH) is regarded as reference data for the remaining EIT data measured from the other CCH for difference imaging to identify the differences in resistivity distribution between the two CCHs. The results of SEIT imaging based on simulation data from the 2D human head finite element model and that from the physical phantom of human head verified this method in detection of unilateral stroke.
机译:中风具有高死亡率和致残率,应迅速诊断以改善预后。对于具有CT,MRI和其他成像设备的医院,诊断卒中不是问题,但对于没有这些设备的社区医院而言,这是困难的。基于正常人头部两个半球的电阻抗基本对称且笔触可以改变这种对称性的机理,提出一种称为对称电阻抗层析成像(SEIT)的快速电阻抗成像方法。在此技术中,从未损坏的颅脑半球(CCH)测得的电阻抗层析成像(EIT)数据被视为从另一个CCH测得的其余EIT数据的参考数据,以进行差异成像,以识别两个CCH之间的电阻率分布差异。基于2D人体头部有限元模型的模拟数据和人体物理模型的SEIT成像结果验证了该方法在单侧卒中检测中的应用。

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