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Effect of Metal Film Thickness on Tamm Plasmon-Coupled Emission

机译:金属膜厚度对Tamm等离子体耦合辐射的影响

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摘要

Tamm plasmons (TPs) are the result of trapping optical energy at the interface between a metal film and a one-dimensional photonic crystal. In contrast to surface plasmons, TPs display unique properties such as the ability of direct optical excitation without the aid of prisms, or gratings, being populated using both S- and P- polarized light, and importantly, they can be created with incident light normal to the surfaces. This latter property has recently been used to obtain Tamm plasmon-coupled emission (TPCE) which beams along a path directly perpendicular to the surface. In this paper the effects of metal film thickness on TPCE are investigated using back focal plane (BFP) imaging and spectral resolutions. The observed experimental results are in agreement with the numerical simulations. The present work provides the basic understanding to design the structures for TPCE, which in turn has potential applications in the fabrication of the active material for light emitting devices, fluorescence based-sensing using microarrays and imaging.
机译:Tamm等离子体激元(TPs)是在金属膜和一维光子晶体之间的界面处捕获光能的结果。与表面等离激元相反,TP具有独特的特性,例如在不使用棱镜或光栅的情况下直接光学激发的能力,同时使用S偏振和P偏振光填充,重要的是,它们可以使用入射光法线来创建。到表面。最近已将后一种特性用于获得Tamm等离子体激元耦合发射(TPCE),该发射沿直接垂直于表面的路径射束。本文使用后焦平面(BFP)成像和光谱分辨率研究了金属膜厚度对TPCE的影响。观察到的实验结果与数值模拟吻合。本工作为设计TPCE的结构提供了基本的理解,而TPCE的结构又在发光器件活性材料的制造,使用微阵列的基于荧光的传感和成像方面具有潜在的应用。

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