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Abnormal conductivity behavior in porous lead telluride films

机译:多孔碲化铅薄膜中的异常电导行为

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摘要

We report the experimental observation of the novel phenomenon of the resistivity decrease in porous PbTe layers during the pore formation process. Investigations were performed on the n-PbTe films with 2.3-μm thickness, which were near the point of the conductivity-type inversion at room temperature. Anodic electrochemical treatment for the porous layers with 41% to 52% porosity fabrication was performed using a KOH-based Norr electrolyte solution. For the porous lead telluride layers, the resistivity value at 300 K decreased 2.5 to 3 times. For the explanation of the observed phenomenon, a physical model is proposed which takes into account the Pb/Te ratio change during the anodic treatment.
机译:我们报告了在孔隙形成过程中多孔PbTe层电阻率降低的新现象的实验观察。对厚度为2.3μm的n-PbTe薄膜进行了研究,该薄膜接近室温下的电导率类型反转点。使用基于KOH的Norr电解质溶液对孔隙率为41%至52%的多孔层进行阳极电化学处理。对于多孔碲化铅层,在300 K下的电阻率值降低了2.5到3倍。为了解释观察到的现象,提出了一种物理模型,该模型考虑了阳极处理过程中Pb / Te比的变化。

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