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Effect of UV/ozone treatment on polystyrene dielectric and its application on organic field-effect transistors

机译:UV /臭氧处理对聚苯乙烯电介质的影响及其在有机场效应晶体管中的应用

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摘要

The influence of UV/ozone treatment on the property of polystyrene (PS) dielectric surface was investigated, and pentacene organic field-effect transistors (OFETs) based on the treated dielectric was fabricated. The dielectric and pentacene active layers were characterized by atomic force microscopy, X-ray photoelectron spectroscopy, and scanning electron microscopy. The results showed that, at short UVO exposure time (<10 s), the chemical composition of PS dielectric surface remained the same. While at long UVO exposure time (>60 s), new chemical groups, including alcohol/ether, carbonyl, and carboxyl/ester groups, were formed. By adjusting the UVO exposure time to 5 s, the hole mobility of the OFETs increased to 0.52 cm2/Vs, and the threshold voltage was positively shifted to -12 V. While the time of UVO treatment exceeded 30 s, the mobility started to shrink, and the off-current was enlarged. These results indicate that, as a simple surface treatment method, UVO treatment could quantitatively modulate the property of PS dielectric surface by controlling the exposure time, and thus, pioneered a new way to modulate the characteristics of organic electronic devices.
机译:研究了紫外线/臭氧处理对聚苯乙烯(PS)电介质表面性能的影响,并制造了基于处理过的电介质的并五苯有机场效应晶体管(OFET)。介电层和并五苯活性层通过原子力显微镜,X射线光电子能谱和扫描电子显微镜表征。结果表明,在短时间的UVO暴露时间(<10秒)下,PS电介质表面的化学成分保持不变。在较长的UVO暴露时间(> 60 s)下,形成了新的化学基团,包括醇/醚,羰基和羧基/酯基。通过将UVO暴露时间调整为5s,OFET的空穴迁移率增加到0.52cm 2 / Vs,阈值电压正移到-12V。 30年代,迁移率开始缩小,截止电流增大。这些结果表明,UVO处理作为一种简单的表面处理方法,可以通过控制曝光时间来定量地调节PS介电表面的性能,从而开创了一种新的方法来调节有机电子器件的特性。

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